[PATCHv1 12/14] power: supply: ds2781: fix race-condition in bin attribute registration

From: Sebastian Reichel
Date: Sun Sep 30 2018 - 18:04:37 EST


This is a follow-up patch to the previous one, which fixed a
race-condition during registration of the attribute group.
This fixes the same issue for the binary attributes by adding
them to the properly registered group. As a side effect the
code is further cleaned up.

Signed-off-by: Sebastian Reichel <sebastian.reichel@xxxxxxxxxxxxx>
---
drivers/power/supply/ds2781_battery.c | 50 ++++++++++-----------------
1 file changed, 19 insertions(+), 31 deletions(-)

diff --git a/drivers/power/supply/ds2781_battery.c b/drivers/power/supply/ds2781_battery.c
index 5bfd4c77eb89..ea8c66abf602 100644
--- a/drivers/power/supply/ds2781_battery.c
+++ b/drivers/power/supply/ds2781_battery.c
@@ -660,7 +660,7 @@ static ssize_t ds2781_write_param_eeprom_bin(struct file *filp,
return count;
}

-static const struct bin_attribute ds2781_param_eeprom_bin_attr = {
+static struct bin_attribute ds2781_param_eeprom_bin_attr = {
.attr = {
.name = "param_eeprom",
.mode = S_IRUGO | S_IWUSR,
@@ -706,7 +706,7 @@ static ssize_t ds2781_write_user_eeprom_bin(struct file *filp,
return count;
}

-static const struct bin_attribute ds2781_user_eeprom_bin_attr = {
+static struct bin_attribute ds2781_user_eeprom_bin_attr = {
.attr = {
.name = "user_eeprom",
.mode = S_IRUGO | S_IWUSR,
@@ -725,7 +725,6 @@ static DEVICE_ATTR(rsgain_setting, S_IRUGO | S_IWUSR, ds2781_get_rsgain_setting,
static DEVICE_ATTR(pio_pin, S_IRUGO | S_IWUSR, ds2781_get_pio_pin,
ds2781_set_pio_pin);

-
static struct attribute *ds2781_sysfs_attrs[] = {
&dev_attr_pmod_enabled.attr,
&dev_attr_sense_resistor_value.attr,
@@ -734,12 +733,26 @@ static struct attribute *ds2781_sysfs_attrs[] = {
NULL
};

-ATTRIBUTE_GROUPS(ds2781_sysfs);
+static struct bin_attribute *ds2781_sysfs_bin_attrs[] = {
+ &ds2781_param_eeprom_bin_attr,
+ &ds2781_user_eeprom_bin_attr,
+ NULL,
+};
+
+static const struct attribute_group ds2781_sysfs_group = {
+ .attrs = ds2781_sysfs_attrs,
+ .bin_attrs = ds2781_sysfs_bin_attrs,
+
+};
+
+static const struct attribute_group *ds2781_sysfs_groups[] = {
+ &ds2781_sysfs_group,
+ NULL,
+};

static int ds2781_battery_probe(struct platform_device *pdev)
{
struct power_supply_config psy_cfg = {};
- int ret = 0;
struct ds2781_device_info *dev_info;

dev_info = devm_kzalloc(&pdev->dev, sizeof(*dev_info), GFP_KERNEL);
@@ -763,35 +776,10 @@ static int ds2781_battery_probe(struct platform_device *pdev)
&psy_cfg);
if (IS_ERR(dev_info->bat)) {
dev_err(dev_info->dev, "failed to register battery\n");
- ret = PTR_ERR(dev_info->bat);
- goto fail;
- }
-
- ret = sysfs_create_bin_file(&dev_info->bat->dev.kobj,
- &ds2781_param_eeprom_bin_attr);
- if (ret) {
- dev_err(dev_info->dev,
- "failed to create param eeprom bin file");
- goto fail_unregister;
- }
-
- ret = sysfs_create_bin_file(&dev_info->bat->dev.kobj,
- &ds2781_user_eeprom_bin_attr);
- if (ret) {
- dev_err(dev_info->dev,
- "failed to create user eeprom bin file");
- goto fail_remove_bin_file;
+ return PTR_ERR(dev_info->bat);
}

return 0;
-
-fail_remove_bin_file:
- sysfs_remove_bin_file(&dev_info->bat->dev.kobj,
- &ds2781_param_eeprom_bin_attr);
-fail_unregister:
- power_supply_unregister(dev_info->bat);
-fail:
- return ret;
}

static int ds2781_battery_remove(struct platform_device *pdev)
--
2.19.0