Re: [PATCH] iio: adc: nxp-sar-adc: use field_get() for EOC bit check

[David Lechner]

On 4/10/26 4:13 PM, Piyush Patle wrote:
> The driver uses FIELD_GET() for constant-mask fields but falls back
> to a raw bit test for the per-channel EOC bit, as the mask depends
> on the runtime channel index. A TODO notes that this should switch
> to field_get() when available.

Could drop this first paragraph, it is a bit redundant.

> 
> Use field_get() here now that runtime-mask support exists, and drop

We like for commit messages to start with the verb like this, so
this would be ideal for the first paragraph of the commit message.

> the obsolete TODO. Since NXP_SAR_ADC_EOC_CH(c) is BIT(c), the
> resulting !-test is semantically identical.
> 
> No functional change.
> 
> Signed-off-by: Piyush Patle <piyushpatle228@xxxxxxxxx>
> ---
Reviewed-by: David Lechner <dlechner@xxxxxxxxxxxx>


And if you are interested in doing more like this, search the IIO
subsystem for __ffs. If it is used with << or >> then there is a
good chance it could be replaced with field_get() or field_prep().