Re: [PATCH net-next] test_bpf: extend tests for 32-bit endianness conversion

[Daniel Borkmann]

On 06/26/2015 05:25 PM, Xi Wang wrote:
> Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if
> the upper bits of the result are zeros (the arm64 JIT had such bugs).
> Extend the two tests to catch this.
>
> Cc: Alexei Starovoitov <ast@xxxxxxxxxxxx>
> Signed-off-by: Xi Wang <xi.wang@xxxxxxxxx>

Thanks for extending the test suite!

Acked-by: Daniel Borkmann <daniel@xxxxxxxxxxxxx>
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