[PATCH v3 18/27] Input: resistive-adc-touch - Simplify with dev_err_probe()

[Krzysztof Kozlowski]

Common pattern of handling deferred probe can be simplified with
dev_err_probe().  Less code and also it prints the error value.

Signed-off-by: Krzysztof Kozlowski <krzk@xxxxxxxxxx>
Reviewed-by: Hans de Goede <hdegoede@xxxxxxxxxx>
Reviewed-by: Andy Shevchenko <andy.shevchenko@xxxxxxxxx>
---
 drivers/input/touchscreen/resistive-adc-touch.c | 8 ++------
 1 file changed, 2 insertions(+), 6 deletions(-)

diff --git a/drivers/input/touchscreen/resistive-adc-touch.c b/drivers/input/touchscreen/resistive-adc-touch.c
index cfc8bb4553f7..46b5a6caef84 100644
--- a/drivers/input/touchscreen/resistive-adc-touch.c
+++ b/drivers/input/touchscreen/resistive-adc-touch.c
@@ -108,12 +108,8 @@ static int grts_probe(struct platform_device *pdev)
 
 	/* get the channels from IIO device */
 	st->iio_chans = devm_iio_channel_get_all(dev);
-	if (IS_ERR(st->iio_chans)) {
-		error = PTR_ERR(st->iio_chans);
-		if (error != -EPROBE_DEFER)
-			dev_err(dev, "can't get iio channels.\n");
-		return error;
-	}
+	if (IS_ERR(st->iio_chans))
+		return dev_err_probe(dev, PTR_ERR(st->iio_chans), "can't get iio channels\n");
 
 	chan = &st->iio_chans[0];
 	st->pressure = false;
-- 
2.17.1