Re: [PATCH 6/6] dt-bindings: thermal: samsung,exynos: remove outdated information on trip point count

[Mateusz Majewski]

> If the old text had nothing to do with the h/w, then I suppose so. I 
> would have assumed the h/w supports some number of thresholds causing 
> some action whether an interrupt or some sort of shutdown.

That is true, but after the mentioned change only 3 are used at the
time: one lower than current temperature, one higher than current
temperature, and one for the critical temperature. So, from the
perspective of somebody writing the devicetree source file this limit is
probably irrelevant?