Re: [PATCH v2 0/8] serial: qcom-geni: fix console corruption
From: Johan Hovold
Date: Wed Sep 11 2024 - 02:18:56 EST
On Fri, Sep 06, 2024 at 03:13:28PM +0200, Johan Hovold wrote:
> This series is a follow-on series to the lockup fixes [1] that addresses
> a number of issues in the Qualcomm GENI console code, including corrupt
> console output during boot, which is a problem for automated CI testing.
> [1] https://lore.kernel.org/lkml/20240704101805.30612-1-johan+linaro@xxxxxxxxxx/
>
> Changes in v2
> - determine poll timeout in set_termios() and avoid hard coding fifo
> size in calculation
> - move fifo drain helper under console ifdef to avoid an unused function
> warning as reported by the kernel test robot
> - drop a redundant active check from fifo drain helper
>
>
> Douglas Anderson (3):
> soc: qcom: geni-se: add GP_LENGTH/IRQ_EN_SET/IRQ_EN_CLEAR registers
> serial: qcom-geni: fix arg types for qcom_geni_serial_poll_bit()
> serial: qcom-geni: introduce qcom_geni_serial_poll_bitfield()
>
> Johan Hovold (5):
> serial: qcom-geni: fix fifo polling timeout
> serial: qcom-geni: fix false console tx restart
> serial: qcom-geni: fix console corruption
> serial: qcom-geni: disable interrupts during console writes
> serial: qcom-geni: fix polled console corruption
Any chance we could these fixes into 6.12-rc1?
Johan