Re: [PATCH 3/3] drm/bridge: ti-sn65dsi83: add test pattern generation support

[Luca Ceresoli]

Hello Marek, Maxime,

On Fri Feb 27, 2026 at 11:57 AM CET, Maxime Ripard wrote:
>> > @@ -134,6 +135,9 @@
>> >   #define  REG_IRQ_STAT_CHA_SOT_BIT_ERR		BIT(2)
>> >   #define  REG_IRQ_STAT_CHA_PLL_UNLOCK		BIT(0)
>> > +static bool sn65dsi83_test_pattern;
>> > +module_param_named(test_pattern, sn65dsi83_test_pattern, bool, 0644);
>>
>> Can this be enabled/disabled at runtime via sysfs attribute instead ?
>
> Then you would have to deal with concurrency with the atomic state
> updates, and it would really be better implemented as a connector
> property.
>
> In other words, it's probably enough for now :)

I agree with Maxime, let's keep it simple, especially as it's a debugging
tool and nobody wants to debug a debugging tool. :)

It can be made more complex in the future if there is a real need.

Luca

--
Luca Ceresoli, Bootlin
Embedded Linux and Kernel engineering
https://bootlin.com