Re: [PATCH RFC v2 0/3] dt-bindings: iio: adc: Add reference, excitation and burn-out properties

[David Lechner]

On 6/22/26 2:58 PM, Kurt Borja wrote:
> On Mon Jun 22, 2026 at 2:38 PM -05, David Lechner wrote:
>> On 6/22/26 2:30 PM, Kurt Borja wrote:
>>> Hi all,
>>>
>>> After submitting a patch series adding support for TI ADS126X ADCs [1],
>>> I was made aware by David [2] that at least two more chip families,
>>> ads1220 [3] and ads1x2c14, share very similar features (though these
>>> chips are not really compatible between them). After that, I found one
>>> more chip with the same features which is already upstream, the
>>> AD4170-4.
>>>
>>> As David explained in [2], these chips are intended to be used with
>>> RTDs, thermocouples or other resistive sensors so they share the
>>> following per-channel features:
>>>
>>>   - Configurable reference selection
>>>   - Burn-out Current Sources (BOCS) for diagnostic purpuses
>>>   - Excitation current sources (usually called IDACs TI) for sensor
>>>     current biasing
>>>
>>> Given that these three features are present in all four devices and
>>> three of these drivers are still under review, my proposal is to have
>>> these features be described in adc.yaml and have this series merged
>>> before the three others [1] [2] [3].
>>>
>>> This series is sent as RFC because I still don't have much experience
>>> with dt-bindings and I don't know if this approach or the properties are
>>> general enough to be described like this.
>>
>> It will probably be easier if I just include these patches when I do
>> v2 of my series (if you don't mind me tweaking them a bit).
> 
> Sure, that's fine by me. I'll add a dependency to your series with b4.
> 
> Want me to send one more version addressing your comments before you
> take it in?
> 

No need. I don't mind fixing it up.