Hi Lukasz
On 21 November 2017 at 16:56, Lukasz Luba <llu.ker.dev@xxxxxxxxx> wrote:
On 21/11/17 14:06, Daniel Lezcano wrote:
Hi all,
On 21/11/2017 12:30, Ionela Voinescu wrote:
[ ... ]
A DT model would be easy to support with the current code but it would
be very inaccurate.
Why ?
[ ... ]
The DT solution won't fly, the reason can be found below.
I agree with Ionela and Punit that the Juno board is not
the best platform to test the static power impact on IPA.
In some other platforms the static power can be 50% or more
of the total power, so it cannot be neglected.
These are the issues.
The static power equation is complicated, here is one known to me.
The leakage function is exponentially influenced by current circuit
supply voltage, body-bias and some constants K_{4,5}.
P_{leak} = L_{g}*V_{dd}*K_{3}*e^{K_{4}*V_{dd}}*e^{K_{5}*V_{bs}}+|
V_{bs}|*I_{Ju}
You forgot one main contributor of static leakage: the temperature
It can also vary depending on technology (CMOS, FinFET, etc).
It would be really hard to approximate by i.e. a polynomial
function with inputs from DT. One size does not fit all.
But can't we linearized around the target temp ? that were we want to
be accurate