Re: [PATCH v2 1/2] dt-bindings: soc: ti: bist: Add BIST for K3 devices

[Krzysztof Kozlowski]

On 28/03/2025 13:42, Neha Malcom Francis wrote:
> On 28/03/25 17:18, Krzysztof Kozlowski wrote:
>> On 28/03/2025 12:14, Neha Malcom Francis wrote:
>>> +properties:
>>> +  compatible:
>>> +    const: ti,j784s4-bist
>>> +
>>> +  reg:
>>> +    maxItems: 2
>>> +
>>> +  reg-names:
>>> +    items:
>>> +      - const: cfg
>>> +      - const: ctrl_mmr
>>> +
>>> +  clocks:
>>> +    maxItems: 1
>>> +
>>> +  power-domains:
>>> +    maxItems: 1
>>> +
>>> +  ti,bist-under-test:
>>> +    $ref: /schemas/types.yaml#/definitions/uint32-array
>>> +    description:
>>> +      the device IDs of the devices under test control of the BIST device, the
>>
>> Still not phandle... What is a "device ID"?
> 
> I took a shot at working with the phandle, however the test devices may
> or may not be present in the devicetree at bootloader stage which is the

If the nodes are not in DT, then you should not reference them here.
Bootloader is supposed to receive all the nodes it is expected to work on.

> only place this BIST driver can execute (I know I shouldn't be bringing
> up the driver here but it's crucial to how I can model this property).
> HW mandates you run it as early as possible before any other software
> executes on the test device.
> 
> So now thinking of other possible ways to define the test devices, we
> have unique HW identifiers [1] for each of the device which is what I've
> used here...
> 
> [1]
> https://github.com/torvalds/linux/blob/master/Documentation/devicetree/bindings/arm/keystone/ti%2Ck3-sci-common.yaml#L31

Then do not redefine properties, but use one common definition.


Best regards,
Krzysztof