Re: [PATCH RFC 3/3] dt-bindings: iio: adc: Add burn-out current properties

[David Lechner]

On 6/18/26 7:33 PM, Kurt Borja wrote:
> Some ADCs incorporate burn-out current sources that provide current to
> the channel's input pins for open-circuit or short-circuit detection.
> 
> Signed-off-by: Kurt Borja <kuurtb@xxxxxxxxx>
> ---
>  Documentation/devicetree/bindings/iio/adc/adc.yaml | 14 ++++++++++++++
>  1 file changed, 14 insertions(+)
> 
> diff --git a/Documentation/devicetree/bindings/iio/adc/adc.yaml b/Documentation/devicetree/bindings/iio/adc/adc.yaml
> index 106b1e317411d5..6b63aac9ac04dd 100644
> --- a/Documentation/devicetree/bindings/iio/adc/adc.yaml
> +++ b/Documentation/devicetree/bindings/iio/adc/adc.yaml
> @@ -106,6 +106,20 @@ properties:
>        This array describes the current configuration of the excitation current
>        sources or the single matched current for all sources.
>  
> +  burn-out-current-microamp:
> +    description:
> +      Burn-out current sources provide current to the channel's input pins for
> +      open-circuit or short-circuit detection.
> +
> +  burn-out-current-polarity:
> +    $ref: /schemas/types.yaml#/definitions/string
> +    description:
> +      Burn-out current sources provide current to the channel's input pins for
> +      open-circuit or short-circuit detection.
> +    enum:
> +      - pull-up
> +      - pull-down
> +
>  anyOf:
>    - oneOf:
>        - required:
> 

This doesn't really work with chips that just have and enable bit to
enable or disable the feature.