Re: [PATCH RFC 3/3] dt-bindings: iio: adc: Add burn-out current properties

[Kurt Borja]

On Fri Jun 19, 2026 at 9:28 AM -05, David Lechner wrote:
> On 6/18/26 7:33 PM, Kurt Borja wrote:
>> Some ADCs incorporate burn-out current sources that provide current to
>> the channel's input pins for open-circuit or short-circuit detection.
>> 
>> Signed-off-by: Kurt Borja <kuurtb@xxxxxxxxx>
>> ---
>>  Documentation/devicetree/bindings/iio/adc/adc.yaml | 14 ++++++++++++++
>>  1 file changed, 14 insertions(+)
>> 
>> diff --git a/Documentation/devicetree/bindings/iio/adc/adc.yaml b/Documentation/devicetree/bindings/iio/adc/adc.yaml
>> index 106b1e317411d5..6b63aac9ac04dd 100644
>> --- a/Documentation/devicetree/bindings/iio/adc/adc.yaml
>> +++ b/Documentation/devicetree/bindings/iio/adc/adc.yaml
>> @@ -106,6 +106,20 @@ properties:
>>        This array describes the current configuration of the excitation current
>>        sources or the single matched current for all sources.
>>  
>> +  burn-out-current-microamp:
>> +    description:
>> +      Burn-out current sources provide current to the channel's input pins for
>> +      open-circuit or short-circuit detection.
>> +
>> +  burn-out-current-polarity:
>> +    $ref: /schemas/types.yaml#/definitions/string
>> +    description:
>> +      Burn-out current sources provide current to the channel's input pins for
>> +      open-circuit or short-circuit detection.
>> +    enum:
>> +      - pull-up
>> +      - pull-down
>> +
>>  anyOf:
>>    - oneOf:
>>        - required:
>> 
>
> This doesn't really work with chips that just have and enable bit to
> enable or disable the feature.

Maybe those devices can use burn-out-current-microamp with a const
value? Is that okay or should another approach be taken?

-- 
Thanks,
 ~ Kurt