Re: [PATCH RFC 3/3] dt-bindings: iio: adc: Add burn-out current properties

[David Lechner]

On 6/19/26 11:46 AM, Kurt Borja wrote:
> On Fri Jun 19, 2026 at 9:28 AM -05, David Lechner wrote:
>> On 6/18/26 7:33 PM, Kurt Borja wrote:
>>> Some ADCs incorporate burn-out current sources that provide current to
>>> the channel's input pins for open-circuit or short-circuit detection.
>>>
>>> Signed-off-by: Kurt Borja <kuurtb@xxxxxxxxx>
>>> ---
>>>  Documentation/devicetree/bindings/iio/adc/adc.yaml | 14 ++++++++++++++
>>>  1 file changed, 14 insertions(+)
>>>
>>> diff --git a/Documentation/devicetree/bindings/iio/adc/adc.yaml b/Documentation/devicetree/bindings/iio/adc/adc.yaml
>>> index 106b1e317411d5..6b63aac9ac04dd 100644
>>> --- a/Documentation/devicetree/bindings/iio/adc/adc.yaml
>>> +++ b/Documentation/devicetree/bindings/iio/adc/adc.yaml
>>> @@ -106,6 +106,20 @@ properties:
>>>        This array describes the current configuration of the excitation current
>>>        sources or the single matched current for all sources.
>>>  
>>> +  burn-out-current-microamp:
>>> +    description:
>>> +      Burn-out current sources provide current to the channel's input pins for
>>> +      open-circuit or short-circuit detection.
>>> +
>>> +  burn-out-current-polarity:
>>> +    $ref: /schemas/types.yaml#/definitions/string
>>> +    description:
>>> +      Burn-out current sources provide current to the channel's input pins for
>>> +      open-circuit or short-circuit detection.
>>> +    enum:
>>> +      - pull-up
>>> +      - pull-down
>>> +
>>>  anyOf:
>>>    - oneOf:
>>>        - required:
>>>
>>
>> This doesn't really work with chips that just have and enable bit to
>> enable or disable the feature.
> 
> Maybe those devices can use burn-out-current-microamp with a const
> value? Is that okay or should another approach be taken?
> 

Maybe better to just leave this one out of the common file?